Robert Aitken

THE EFFECT OF DIFFERENT TEST SETS ON QUALITY LEVEL PREDICTION: WHEN IS 80% BETTER THAN 90%?

P.C. Maxwell, Robert Aitken, V. Johansen et al. · 2005 · 174 citations

Engineering, Computer Engineering, Quality Assurance +13

Current ratios: a self-scaling technique for production I/sub DDQ/ testing

Alexander P. Maxwell, P. O'Neill, Robert Aitken et al. · 2003 · 159 citations

Engineering, Computer Engineering, Electrical Engineering +17

IDDQ and AC scan: the war against unmodelled defects

P.C. Maxwell, Robert Aitken, K.R. Kollitz et al. · 2002 · 145 citations

Engineering, Computer Engineering, Electrical Engineering +17

Biased voting: A method for simulating CMOS bridging faults in the presence of variable gate logic thresholds

P.C. Maxwell, Robert Aitken · 2002 · 145 citations

Engineering, Computer Engineering, Electrical Engineering +16

An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing

P. Nigh, W. Needham, Kenneth M. Butler et al. · 2002 · 142 citations

Engineering, Computer Engineering, Electrical Engineering +16