Gold Standard Simulations (United Kingdom)

Variability Aware Simulation Based Design- Technology Cooptimization (DTCO) Flow in 14 nm FinFET/SRAM Cooptimization

Asen Asenov, B. Cheng, Xingsheng Wang et al. · IEEE Transactions on Electron Devices · 2014 · 64 citations

Engineering, Vlsi Design, Electronic Design +17

Interplay Between Process-Induced and Statistical Variability in 14-nm CMOS Technology Double-Gate SOI FinFETs

Xingsheng Wang, B. Cheng, A. R. Brown et al. · IEEE Transactions on Electron Devices · 2013 · 56 citations

Device Modeling, Electrical Engineering, Comprehensive Simulation Study +14

Simulation Study of Dominant Statistical Variability Sources in 32-nm High- $\kappa$/Metal Gate CMOS

Xingsheng Wang, Gareth Roy, O. Saxod et al. · IEEE Electron Device Letters · 2012 · 55 citations

Device Modeling, Electrical Engineering, Engineering +13

Statistical Variability in Fully Depleted SOI MOSFETs Due to Random Dopant Fluctuations in the Source and Drain Extensions

Stanislav Markov, B. Cheng, Asen Asenov · IEEE Electron Device Letters · 2012 · 45 citations

Device Modeling, Low-power Electronics, Electrical Engineering +14

Comparative Simulation Analysis of Process-Induced Variability in Nanoscale SOI and Bulk Trigate FinFETs

A. R. Brown, Nicolas Daval, K.K. Bourdelle et al. · IEEE Transactions on Electron Devices · 2013 · 40 citations

Engineering, Vlsi Design, Silicon On Insulator +18