4
Publications
288
Citations
4
H-Index
2002
Active since
Affiliations
Hewlett-Packard (United States)(Current)
P. O'Neill is an author at Hewlett-Packard (United States) specializing in computer engineering, reliability engineering, and design for testing.
Top concepts
EngineeringMeasurementDesign For TestingComputer EngineeringReliability EngineeringEducationInstrumentationMicroelectronicsSoftware TestingHardware Security
Publications per year
2002–2008
4
4
Current ratios: a self-scaling technique for production I/sub DDQ/ testing
Alexander P. Maxwell, P. O'Neill, Robert Aitken et al. · 2003 · 159 citations
Current ratios: a self-scaling technique for production IDDQ testing
Alexander P. Maxwell, P. O'Neill, Robert Aitken et al. · 2002 · 84 citations
Production Multivariate Outlier Detection Using Principal Components
P. O'Neill · 2008 · 35 citations
Wafer-level defect-based testing using enhanced voltage stress and statistical test data evaluation
Minh Quach, Tuan Pham, T. Figal et al. · 2003 · 10 citations
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