1
Publications
10
Citations
1
H-Index
2003
Active since
Affiliations
Agilent Technologies (United States)(Current)
T. Figal is an author at Agilent Technologies (United States).
Publications per year
2003–2003
1
1
Wafer-level defect-based testing using enhanced voltage stress and statistical test data evaluation
Minh Quach, Tuan Pham, T. Figal et al. · 2003 · 10 citations
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