Concepedia

In-circuit Debugging

In-Circuit Debugging is a hardware-assisted debugging technique that enables real-time observation and control of a microcontroller’s internal state while it remains physically and electrically connected to its target embedded system.

46

Publications

1.6K

Citations

114

Authors

49

Institutions

Publications per year

2017–2026

3

Parents

Publications

46

A reconfigurable design-for-debug infrastructure for SoCs

M. Abramovici, P. Bradley, Kumar Dwarakanath et al. · 2006 · 276 citations

, , +17

Design for debug: catching design errors in digital chips

Bart Vermeulen, S.K. Goel · IEEE Design & Test of Computers · 2002 · 121 citations

, , +16

Silicon debug: scan chains alone are not enough

G.J. van Rootselaar, Bart Vermeulen · 2003 · 86 citations

, , +14

On using lossless compression of debug data in embedded logic analysis

Ehab Anis, Nicola Nicolici · 2007 · 81 citations

, , +13

The good, the bad, and the ugly of silicon debug

D. Josephson · 2006 · 66 citations

, , +15

1–5 of 46

Authors

114

  1. BV
    Bart Vermeulen

    NXP (Netherlands), Netherlands

    4 publications · 236 citations

    4

    h-index

  2. SJ
    Steven J. E. Wilton

    University of British Columbia, Canada

    4 publications · 106 citations

    4

    h-index

  3. MR
    M. Riley

    IBM (United States), United States

    2 publications · 36 citations

    2

    h-index

  4. GV
    G.J. van Rootselaar

    Philips (Netherlands), Netherlands

    2 publications · 103 citations

    2

    h-index

  5. DA
    David A. Mellis

    Massachusetts Institute of Technology, United States

    2 publications · 110 citations

    2

    h-index

1–5 of 114

Institutions

49

  1. Intel (United States)

    Santa Clara, United States

    5 h-index

    16 publications

    349 citations

  2. University of British Columbia

    Vancouver, Canada

    4 h-index

    8 publications

    212 citations

  3. Philips (Netherlands)

    Amsterdam, The Netherlands

    3 h-index

    5 publications

    431 citations

  4. Stanford University

    Stanford, United States

    2 h-index

    2 publications

    110 citations

  5. McMaster University

    Hamilton, Canada

    2 h-index

    4 publications

    200 citations

  6. University of Cincinnati

    Cincinnati, United States

    2 h-index

    4 publications

    76 citations

  7. IBM (United States)

    Armonk, United States

    2 h-index

    5 publications

    93 citations

  8. University of Bremen

    Bremen, Germany

    2 h-index

    3 publications

    33 citations

1–8 of 49

Venues

  1. IEEE Design & Test of Computers

    5 publications · 178 citations

    5

    h-index

  2. Design, Automation, and Test in Europe

    Conference · 2 publications · 50 citations

    2

    h-index

  3. Proceedings/Proceedings - International Test Conference

    ITC · 1 publications · 21 citations

    1

    h-index

  4. Microprocessors and Microsystems

    MICPRO · 1 publications · 13 citations

    1

    h-index

  5. 1

    h-index

1–5