S.K. Goel

Design for debug: catching design errors in digital chips

Bart Vermeulen, S.K. Goel · IEEE Design & Test of Computers · 2002 · 120 citations

Digital Chips, Debugger Software, Engineering +16

Core-based scan architecture for silicon debug

Bart Vermeulen, T. Waayers, S.K. Goel · 2003 · 91 citations

Hardware Security, Core-based Scan Architecture, Engineering +14

Test-Architecture Optimization and Test Scheduling for TSV-Based 3-D Stacked ICs

Brandon Noia, Krishnendu Chakrabarty, S.K. Goel et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2011 · 63 citations

3D Ic Architecture, Test Scheduling, Vlsi Design +15

Cluster-based test architecture design for system-on-chip

S.K. Goel, Erik Jan Marinissen · 2003 · 47 citations

Hardware Security, Engineering, Computational Testing +13

Test resource optimization for multi-site testing of SOCs under ATE memory depth constraints

V. Iyengar, S.K. Goel, Erik Jan Marinissen et al. · 2003 · 45 citations

Engineering, Mem Testing, Computer Architecture +16