SUSS MicroTec (Germany)

VNA calibration

Andrej Rumiantsev, Nick Ridler · IEEE Microwave Magazine · 2008 · 172 citations

Sensor Calibration, Vector Network Analysers, Engineering +15

UV enhanced substrate conformal imprint lithography (UV-SCIL) technique for photonic crystals patterning in LED manufacturing

Ran Ji, Michael Hornung, Marc A. Verschuuren et al. · Microelectronic Engineering · 2009 · 144 citations

Materials Science, Photonics, Photonic Sensor +11

Formation of precise 2D Au particle arrays via thermally induced dewetting on pre-patterned substrates

Dong Wang, Ran Ji, Peter Schaaf · Beilstein Journal of Nanotechnology · 2011 · 110 citations · Full text

Engineering, Beam Lithography, Nanostructure Synthesis +16

Advanced mask aligner lithography: new illumination system

Reinhard Voelkel, Uwe Vogler, A. Bich et al. · Optics Express · 2010 · 90 citations · Full text

Proximity Lithography, Engineering, New Illumination System +11

Ordered arrays of nanoporous gold nanoparticles

Dong Wang, Ran Ji, Arne Albrecht et al. · Beilstein Journal of Nanotechnology · 2012 · 61 citations · Full text