Nick Ridler - Concepedia

Author

Nick Ridler

Also Known As

D Laycock, N M Ridler, N Ridler, N. M. Ridler, N. Ridler, N.M. Ridler, Nick M. Ridler, Nick M Ridler, Nick M. Ridler, Nick Ridler

235

Publications

4.1K

Citations

H-Index

Concepts

All Affiliations

National Physical Laboratory University of Leeds Imperial College London University of Glasgow Nanjing University of Science and Technology

About

Nick Ridler is an author at National Physical Laboratory specializing in engineering, education, and instrumentation.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	21	42	2.6K
2	Education	17	27	807
3	Applied Physics	10	11	1.7K
4	Natural Sciences	3	3	1.5K
5	Biostatistics	1	1	16

Nick Ridler

Publications

3.6K

Citations

H-Index

Page 1

	Year	Citations
The 2017 terahertz science and technology roadmap Sukhdeep Dhillon, Miriam S. Vitiello, E. H. Linfield, Journal of Physics D Applied Physics Thz PhotonicsTerahertz TechnologyEngineeringThz RadiationTerahertz Photonics	2017	1.4K
The 2023 terahertz science and technology roadmap Alfred Leitenstorfer, A. S. Moskalenko, Tobias Kampfrath, Journal of Physics D Applied Physics	2023	425
3-D Printed Metal-Pipe Rectangular Waveguides Mario D’Auria, William J. Otter, J. Hazell, IEEE Transactions on Components Packaging and Manufacturing Technology	2015	296
VNA calibration Andrej Rumiantsev, Nick Ridler IEEE Microwave Magazine Sensor CalibrationVector Network AnalysersEngineeringSensorsMeasurement	2008	172
An approach to the treatment of uncertainty in complex S-parameter measurements Nick Ridler, Martin Salter Metrologia EngineeringMeasurementMeasurement Standards (Educational Assessment)EducationUncertain Data	2002	112
3D printed 1.1 THz waveguides William J. Otter, Nick Ridler, H Yasukochi, Electronics Letters	2017	60
Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements Mira Naftaly, Roland Clarke, David A. Humphreys, Proceedings of the IEEE Thz PhotonicsTerahertz TechnologyEngineeringMeasurementEducation	2017	44
Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique Yi Wang, Xiaobang Shang, Nick Ridler, IEEE Transactions on Instrumentation and Measurement Materials ScienceElectrical EngineeringEngineeringRf SemiconductorCalibration	2019	44
Propagating S-parameter uncertainties to other measurement quantities Nick Ridler, Martin Salter EngineeringMeasurementUncertain DataUncertainty FormalismUncertainty Modeling	2001	43
Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration Yi Wang, Xiaobang Shang, Nick Ridler, IEEE Transactions on Terahertz Science and Technology EngineeringMeasurementOptical TestingMechanical EngineeringVector Network Analyzer	2020	42

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