Self-aligned Patterning

Self-Aligned Patterning is a lithographic patterning technique in semiconductor manufacturing that belongs to the class of pattern transfer methods, distinguished by its use of inherent alignment through material or process self-organization to eliminate overlay errors between successive patterning steps.

97

Publications

3.5K

Citations

611

Authors

99

Institutions

Publications per year

2017–2026

23

Authors

611

  1. KO
    Kenichi Oyama

    Tokyo Electron (Japan), Japan

    10 publications · 196 citations

    10

    h-index

  2. AH
    Arisa Hara

    Tokyo Electron (Japan), Japan

    9 publications · 179 citations

    9

    h-index

  3. HY
    Hidetami Yaegashi

    Tokyo Electron (Japan), Japan

    9 publications · 181 citations

    9

    h-index

  4. SN
    Sakurako Natori

    Tokyo Electron (Japan), Japan

    8 publications · 167 citations

    8

    h-index

  5. YD
    Yuelin Du

    University of Illinois Urbana-Champaign, United States

    7 publications · 150 citations

    7

    h-index

1–5 of 611

Venues

  1. 17

    h-index

  2. 2

    h-index

  3. IEEE Transactions on Electron Devices

    2 publications · 66 citations

    2

    h-index

  4. Nanoscale

    2 publications · 58 citations

    2

    h-index

  5. Applied Physics Letters

    2 publications · 39 citations

    2

    h-index

1–5