Concepedia

Scan Chain Testing

Scan Chain Testing is a built-in self-test methodology that enables the detection of faults in digital circuits by serially shifting test patterns into and out of flip-flops configured in a scan chain architecture.

200

Publications

8K

Citations

462

Authors

141

Institutions

Publications per year

2017–2026

15

Parents

Publications

200

Scan based side channel attack on dedicated hardware implementations of Data Encryption Standard

Bo Yang, Kaijie Wu, Ramesh Karri · 2005 · 345 citations

, , +14

Failure diagnosis of structured VLSI

J.A. Waicukauski, Eric Lindbloom · IEEE Design & Test of Computers · 1989 · 282 citations

, , +17

Test vector decompression via cyclical scan chains and its application to testing core-based designs

Abhijit Jas, Nur A. Touba · 2002 · 274 citations

, , +17

Broad-side delay test

J. Savir, S. Patil · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1994 · 255 citations

, , +14

Scan-based transition test

J. Savir, S. Patil · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1993 · 203 citations

, , +13

1–5 of 200

Authors

462

  1. IP
    Irith Pomeranz

    University of Iowa, United States

    13 publications · 413 citations

    12

    h-index

  2. SR
    S.M. Reddy

    University of Iowa, United States

    12 publications · 466 citations

    12

    h-index

  3. KC
    Krishnendu Chakrabarty

    Duke University, United States

    9 publications · 427 citations

    9

    h-index

  4. BR
    Bruno Rouzeyre

    Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France

    8 publications · 303 citations

    8

    h-index

  5. JR
    Janusz Rajski

    Mentor Technologies, United States

    8 publications · 517 citations

    8

    h-index

1–5 of 462

Institutions

141

  1. Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier

    Montpellier, France

    12 h-index

    54 publications

    2K citations

  2. Purdue University West Lafayette

    West Lafayette, United States

    12 h-index

    13 publications

    413 citations

  3. University of Iowa

    Iowa City, United States

    12 h-index

    21 publications

    874 citations

  4. Mentor Technologies

    Tulsa, United States

    11 h-index

    24 publications

    918 citations

  5. Université de Montpellier

    Montpellier, France

    10 h-index

    44 publications

    1.3K citations

  6. Centre National de la Recherche Scientifique

    Paris, France

    10 h-index

    47 publications

    1.7K citations

  7. Siemens (Hungary)

    Budapest, Hungary

    10 h-index

    25 publications

    1.9K citations

  8. IBM (United States)

    Armonk, United States

    9 h-index

    12 publications

    1.4K citations

1–8 of 141

Venues

  1. 14

    h-index

  2. 10

    h-index

  3. IEEE Design & Test of Computers

    7 publications · 669 citations

    7

    h-index

  4. 4

    h-index

  5. Journal of Electronic Testing

    JETTA · 4 publications · 65 citations

    4

    h-index

1–5