Embedded Deterministic Test

Embedded Deterministic Test is a deterministic built-in self-test methodology that enables on-chip generation of precise, algorithmically defined test patterns for targeted defect detection, distinguishing itself from stochastic or pseudorandom approaches by ensuring complete control over test stimulus content and timing.

Publications

1.7K

Citations

Authors

Institutions

Publications per year

2017–2026

Variants

Edt

Parents

Built-in Self-test

Publications

Embedded Deterministic Test

Janusz Rajski, Jerzy Tyszer, Mark Kassab et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2004 · 526 citations

Engineering, Computer Engineering, Computer Science +13

Embedded deterministic test for low cost manufacturing test

J. Rajski, Jerzy Tyszer, Mark Kassab et al. · 2003 · 402 citations

Engineering, Computer Engineering, Electrical Engineering +13

Embedded deterministic test for low-cost manufacturing

Janusz Rajski, Mark Kassab, Nilanjan Mukherjee et al. · IEEE Design & Test of Computers · 2003 · 64 citations

Engineering, Computer Engineering, Computer Science +12

Built-in test pattern generation for high-performance circuits using twisted-ring counters

Krishnendu Chakrabarty, B.T. Murray, V. Iyengar · 2003 · 53 citations

Engineering, Computer Engineering, Computer Science +13

Using an embedded processor for efficient deterministic testing of systems-on-a-chip

Abhijit Jas, Nur A. Touba · 2003 · 53 citations

Engineering, Computer Engineering, Computer Science +15

1–5 of 24

Authors

JT
Jerzy Tyszer
Poznań University of Technology, Poland
12 publications · 1.3K citations
12
h-index
JR
Janusz Rajski
Mentor Technologies, United States
10 publications · 864 citations
10
h-index
NM
Nilanjan Mukherjee
Mentor Technologies, United States
9 publications · 1.2K citations
9
h-index
GM
Grzegorz Mrugalski
Poznań University of Technology, Poland
8 publications · 614 citations
8
h-index
MK
Mark Kassab
Mentor Technologies, United States
6 publications · 1K citations
6
h-index

1–5 of 53

Institutions

1–8 of 17

Venues

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
5 publications · 639 citations
5
h-index
Proceedings - ACM IEEE Design Automation Conference
2 publications · 67 citations
2
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2 publications · 86 citations
2
h-index
IEEE Transactions on Instrumentation and Measurement
1 publications · 14 citations
1
h-index
IEEE Design & Test of Computers
1 publications · 64 citations
1
h-index

1–5