B.T. Murray

Hierarchical test generation using precomputed tests for modules

B.T. Murray, John P. Hayes · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1990 · 160 citations

Engineering, Verification, Large Circuits +21

Low-cost on-line fault detection using control flow assertions

Rajesh Venkatasubramanian, John P. Hayes, B.T. Murray · 2004 · 152 citations

Program Checking, Engineering, Verification +24

Hierarchical test generation using precomputed testsd for modules

B.T. Murray, John P. Hayes · 2003 · 100 citations

Engineering, Verification, Test Data Generation +17

Testing ICs: getting to the core of the problem

B.T. Murray, John P. Hayes · Computer · 1996 · 95 citations

Engineering, Verification, Integrated Circuits +16

Transparent recovery from intermittent faults in time-triggered distributed systems

Nagarajan Kandasamy, John P. Hayes, B.T. Murray · IEEE Transactions on Computers · 2003 · 89 citations

Cluster Computing, Engineering, Computer Architecture +18