Dopant Redistribution
Dopant Redistribution is a semiconductor fabrication phenomenon in which dopant atoms within a material are displaced from their original implanted positions due to thermal or kinetic effects during processing, thereby altering the intended doping profile.
152
Publications
4.9K
Citations
596
Authors
192
Institutions
Publications per year
2017–2026
9
Parents
152
Monte Carlo simulation of two-dimensional implanted dopant distributions at mask edges
G. Hobler · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1995 · 129 citations
Engineering, Computational Engineering, Computational Materials Science +11
1–5 of 152
596
8
h-index
Nizhny Novgorod State University of Architecture and Civil Engineering, Russia
6 publications · 143 citations
6
h-index
5
h-index
5
h-index
4
h-index
1–5 of 596
192

Varian Medical Systems (United States)
Palo Alto, United States
9 h-index
22 publications
745 citations
University of Florida
Gainesville, United States
7 h-index
18 publications
576 citations
AT&T (United States)
Bedminster, United States
6 h-index
16 publications
955 citations
IBM Research - Thomas J. Watson Research Center
Yorktown Heights, United States
5 h-index
16 publications
428 citations

Oak Ridge National Laboratory
Oak Ridge, United States
5 h-index
11 publications
848 citations
Institute for Microelectronics and Microsystems
Catania, Italy
5 h-index
28 publications
1.3K citations
Siemens (Germany)
Munich, Germany
5 h-index
9 publications
348 citations

KTH Royal Institute of Technology
Stockholm, Sweden
4 h-index
12 publications
208 citations
1–8 of 192
26 publications · 983 citations
19
h-index
25 publications · 795 citations
18
h-index
JES · 15 publications · 372 citations
11
h-index
5 publications · 150 citations
5
h-index
5 publications · 158 citations
5
h-index
1–5