C.-Y. Lu

High performance 22/20nm FinFET CMOS devices with advanced high-K/metal gate scheme

Chau-Neng Wu, Dongyang Lin, A. Keshavarzi et al. · 2010 · 105 citations

Finfet Cmos Devices, Electrical Engineering, Engineering +12

Reverse short-channel effects on threshold voltage in submicrometer salicide devices

C.-Y. Lu, J.M. Sung · IEEE Electron Device Letters · 1989 · 96 citations

Semiconductor Technology, Electrical Engineering, Semiconductor Device +12

Anomalous C-V characteristics of implanted poly MOS structure in n/sup +//p/sup +/ dual-gate CMOS technology

C.-Y. Lu, J.M. Sung, H.C. Kirsch et al. · IEEE Electron Device Letters · 1989 · 85 citations

Materials Engineering, Materials Science, Electrical Engineering +12

Explosion of poly-silicide links in laser programmable redundancy for VLSI memory repair

C.-Y. Lu, J.D. Chlipala, Leonard M. Scarfone · IEEE Transactions on Electron Devices · 1989 · 67 citations

Engineering, Vlsi Design, Laser Applications +25

A comprehensive study on p/sup +/ polysilicon-gate MOSFET's instability with fluorine incorporation

J.J. Sung, C.-Y. Lu · IEEE Transactions on Electron Devices · 1990 · 63 citations

Comprehensive Study, Semiconductor Technology, Electrical Engineering +11