J.J. Sung

A comprehensive study on p/sup +/ polysilicon-gate MOSFET's instability with fluorine incorporation

J.J. Sung, C.-Y. Lu · IEEE Transactions on Electron Devices · 1990 · 63 citations

Engineering, Electrical Engineering, Electronic Materials +15

Process limitation and device design tradeoffs of self-aligned TiSi/sub 2/ junction formation in submicrometer CMOS devices

C.-Y. Lu, J.J. Sung, R. Liu et al. · IEEE Transactions on Electron Devices · 1991 · 63 citations

Engineering, Electrical Engineering, Materials Science +17

A 6 GHz 68 mW BiCMOS phase-locked loop

Behzad Razavi, J.J. Sung · IEEE Journal of Solid-State Circuits · 1994 · 40 citations

Engineering, Electrical Engineering, Analog Electronics +16

High-performance salicide shallow-junction CMOS devices for submicrometer VLSI application in twin-tub VI

C.-Y. Lu, J.J. Sung, H.C. Kirsch et al. · IEEE Transactions on Electron Devices · 1989 · 27 citations

Engineering, Computer Engineering, Electrical Engineering +17

The effects of rapid thermal processing on ultra-shallow junctions for deep sub-micron MOSFETs

R Liu, C.-Y. Lu, J.J. Sung et al. · Solid-State Electronics · 1995 · 10 citations

Engineering, Electrical Engineering, Materials Science +16