Concepedia

Cross-sectional Microscopy

Cross-Sectional Microscopy is a materials characterization technique that involves imaging the internal structure of a semiconductor interface in the plane perpendicular to its surface, enabling atomic-scale resolution of interfacial morphology, defects, and compositional variations across layered heterostructures.

651

Publications

28.6K

Citations

2.7K

Authors

568

Institutions

Publications per year

2017–2026

45

Parents

Publications

651

Controlled Growth and Structures of Molecular-Scale Silicon Nanowires

Yue Wu, Yi Cui, Lynn Huynh et al. · Nano Letters · 2004 · 953 citations

, , +17

Totally relaxed Ge<i>x</i>Si1−<i>x</i> layers with low threading dislocation densities grown on Si substrates

Eugene A. Fitzgerald, Y. H. Xie, M. L. Green et al. · Applied Physics Letters · 1991 · 688 citations

, , +16

Structure and stability of ultrathin zirconium oxide layers on Si(001)

M. Copel, M. Gribelyuk, Evgeni Gusev · Applied Physics Letters · 2000 · 667 citations

, , +17

The preparation of cross‐section specimens for transmission electron microscopy

J. C. Bravman, Robert Sinclair · Journal of Electron Microscopy Technique · 1984 · 524 citations

, , +11

Fabrication and properties of epitaxial ferroelectric heterostructures with (SrRuO3) isotropic metallic oxide electrodes

Chang‐Beom Eom, R. B. van Dover, Julia M. Phillips et al. · Applied Physics Letters · 1993 · 439 citations

, , +16

1–5 of 651

Authors

2.7K

  1. JS
    J. S. Williams

    Australian National University, Australia

    9 publications · 555 citations

    9

    h-index

  2. DJ
    David J. Smith

    Arizona State University, United States

    9 publications · 291 citations

    9

    h-index

  3. ET
    Edward T. Yu

    University of California San Diego, United States

    7 publications · 243 citations

    7

    h-index

  4. RM
    R. M. Feenstra

    Carnegie Mellon University, United States

    6 publications · 360 citations

    6

    h-index

  5. MB
    Matthew B. Johnson

    University of Oklahoma, United States

    6 publications · 287 citations

    6

    h-index

1–5 of 2.7K

Institutions

568

  1. IBM Research - Thomas J. Watson Research Center

    Yorktown Heights, United States

    17 h-index

    61 publications

    4.2K citations

  2. Australian National University

    Canberra, Australia

    14 h-index

    56 publications

    2.7K citations

  3. Chinese Academy of Sciences

    Beijing, China

    13 h-index

    67 publications

    2K citations

  4. University of Illinois Urbana-Champaign

    Urbana, United States

    11 h-index

    38 publications

    1.6K citations

  5. The University of Texas at Austin

    Austin, United States

    11 h-index

    44 publications

    1.3K citations

  6. Centre National de la Recherche Scientifique

    Paris, France

    10 h-index

    42 publications

    1.2K citations

  7. Hungarian Academy of Sciences

    Budapest, Hungary

    10 h-index

    27 publications

    539 citations

  8. AT&T (United States)

    Bedminster, United States

    10 h-index

    48 publications

    10K citations

1–8 of 568

Venues

  1. Applied Physics Letters

    190 publications · 10.9K citations

    55

    h-index

  2. Journal of Applied Physics

    97 publications · 3.8K citations

    34

    h-index

  3. Japanese Journal of Applied Physics

    JJAP · 35 publications · 847 citations

    18

    h-index

  4. 15

    h-index

  5. 12

    h-index

1–5