Concepedia

J. C. Bravman

JC

82

Publications

5.2K

Citations

37

H-Index

1983

Active since

Affiliations

Stanford University(Current)

Intel (United States)

Advanced Light Source

Stanford Synchrotron Radiation Lightsource

IBM Research - Almaden

J. C. Bravman is an author at Stanford University specializing in engineering, applied physics, and materials science.

Top concepts

EngineeringMaterial ScienceApplied PhysicsThin FilmsMicrostructureMaterials EngineeringSurface ScienceMechanics Of MaterialsSolid MechanicsMechanical Engineering

Publications per year

1983–2004

82

Publications

82

The preparation of cross‐section specimens for transmission electron microscopy

J. C. Bravman, Robert Sinclair · Journal of Electron Microscopy Technique · 1984 · 523 citations

Thin Film Physics, Engineering, Transmission Electron Microscopy +20

Mechanical deflection of cantilever microbeams: A new technique for testing the mechanical properties of thin films

Timothy P. Weihs, Soon-Il Hong, J. C. Bravman et al. · Journal of materials research/Pratt's guide to venture capital sources · 1988 · 376 citations

Materials Science, Engineering, Micromechanics +12

Separation of film thickness and grain boundary strengthening effects in Al thin films on Si

Ramnath Venkatraman, J. C. Bravman · Journal of materials research/Pratt's guide to venture capital sources · 1992 · 346 citations

Materials Science, Aluminium Nitride, Engineering +9

Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films

Nobumichi Tamura, Alastair A. MacDowell, Ralph Spolenak et al. · Journal of Synchrotron Radiation · 2003 · 266 citations · Full text

X-ray Spectroscopy, Engineering, Severe Plastic Deformation +22

Thermal strain and stress in copper thin films

Richard P. Vinci, E. M. Zielinski, J. C. Bravman · Thin Solid Films · 1995 · 263 citations

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