Concepedia

Charge Trapping Analysis

Charge Trapping Analysis is a device characterization method that identifies and quantifies the capture and retention of charge carriers within defect states of semiconductor materials or interfaces, distinguishing it from other electrical characterization techniques by its focus on transient and non-equilibrium charge immobilization effects.

424

Publications

15.8K

Citations

1.6K

Authors

454

Institutions

Publications per year

2017–2026

75

Parents

Publications

424

Eliminating degradation and uncovering ion-trapping dynamics in electrochromic WO3 thin films

Rui‐Tao Wen, Claes G. Granqvist, Gunnar A. Niklasson · Nature Materials · 2015 · 666 citations · Full text

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A Current-Transient Methodology for Trap Analysis for GaN High Electron Mobility Transistors

Jungwoo Joh, Jesús A. del Alamo · IEEE Transactions on Electron Devices · 2010 · 416 citations

, , +17

The evaluation of electron trapping parameters from conductivity glow curves in cadmium sulphide

K. H. Nicholas, J. Woods · British Journal of Applied Physics · 1964 · 398 citations

, , +14

Charge trapping and detrapping in polymeric materials

George Chen, Zhiqiang Xu · Journal of Applied Physics · 2009 · 262 citations

, , +14

Determination of insulator bulk trapped charge densities and centroids from photocurrent-voltage charactersitcs of MOS structures

D. J. DiMaria · Journal of Applied Physics · 1976 · 202 citations

, , +17

1–5 of 424

Authors

1.6K

  1. BK
    B. Kaczer

    IMEC, Belgium

    12 publications · 462 citations

    11

    h-index

  2. GG
    G. Groeseneken

    IMEC, Belgium

    10 publications · 422 citations

    10

    h-index

  3. GB
    G. Bersuker

    The University of Texas at Austin, United States

    10 publications · 388 citations

    10

    h-index

  4. JV
    Jan Van Houdt

    IMEC, Belgium

    9 publications · 291 citations

    9

    h-index

  5. HL
    Hang-Ting Lue

    Macronix International (Taiwan), Taiwan

    7 publications · 151 citations

    7

    h-index

1–5 of 1.6K

Institutions

454

  1. IMEC

    Leuven, Belgium

    16 h-index

    135 publications

    4.8K citations

  2. KU Leuven

    Leuven, Belgium

    13 h-index

    59 publications

    2.5K citations

  3. Centre National de la Recherche Scientifique

    Paris, France

    11 h-index

    37 publications

    993 citations

  4. IBM (United States)

    Armonk, United States

    10 h-index

    43 publications

    2.4K citations

  5. National University of Singapore

    Singapore, Singapore

    10 h-index

    40 publications

    904 citations

  6. Commissariat à l'Énergie Atomique et aux Énergies Alternatives

    Paris, France

    10 h-index

    35 publications

    2K citations

  7. IBM Research - Thomas J. Watson Research Center

    Yorktown Heights, United States

    10 h-index

    19 publications

    1.1K citations

  8. University of Padua

    Padua, Italy

    9 h-index

    38 publications

    1.6K citations

1–8 of 454

Venues

  1. Journal of Applied Physics

    50 publications · 2.2K citations

    26

    h-index

  2. IEEE Transactions on Electron Devices

    46 publications · 1.9K citations

    26

    h-index

  3. Applied Physics Letters

    35 publications · 1.2K citations

    20

    h-index

  4. IEEE Transactions on Nuclear Science

    26 publications · 1K citations

    19

    h-index

  5. IEEE Electron Device Letters

    25 publications · 900 citations

    18

    h-index

1–5