British Journal of Applied Physics · 1964 · 398 citations · 22 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsCarrier TransportElectrical CharacterizationOptical Properties Of SemiconductorsSemiconductor PhysicsCapture Cross SectionsCharge Trapping AnalysisCharge TrapsExperimental CharacterizationGlow CurvesTrap CharacterizationTraps
An extensive experimental examination of conductivity glow curves and their analysis has been made on a variety of CdS crystals. A large number of analytical methods have been used to evaluate trap depths and capture cross sections. It is shown that it is possible to obtain consistent results and determine whether retrapping occurs provided an experimental procedure is adopted to produce isolated, non-overlapping, glow curves. Good agreement has been obtained between trap parameters calculated from (1) glow data and (2) photoconductive decay.
22
Evaluation of Thermal Activation Energies from Glow Curves
A. Halperin, A. A. Braner · Physical Review · 1960 · 603 citations
Natural Sciences, Chemistry, Physics +14