Harry Hsia

Investigation and Localization of the SiGe Source/Drain (S/D) Strain-Induced Defects in PMOSFET With 45-nm CMOS Technology

Chiao-Yang Cheng, Y.K. Fang, J.C. Hsieh et al. · IEEE Electron Device Letters · 2007 · 35 citations

Device Modeling, Semiconductor Technology, Electrical Engineering +15

Foundry Perspectives on 2.5D/3D Integration and Roadmap

Douglas Yu, Chuei-Tang Wang, Harry Hsia · 2021 IEEE International Electron Devices Meeting (IEDM) · 2021 · 35 citations

Engineering, Device Integration, Electronic Design Automation +20

Design and Analysis of Logic-HBM2E Power Delivery System on CoWoS^® Platform with Deep Trench Capacitor

W. T. Chen, C. C. Lin, Chung-Hsien Tsai et al. · 2020 · 26 citations

Low-power Electronics, Electrical Engineering, Engineering +14

Heterogeneous Integration of a Compact Universal Photonic Engine for Silicon Photonics Applications in HPC

Harry Hsia, Chung-Hao Tsai, K. C. Ting et al. · 2021 · 24 citations

Engineering, Device Integration, Integrated Photonics +16

Integrated Optical Interconnect Systems (iOIS) for Silicon Photonics Applications in HPC

Harry Hsia, Shih-Peng Tai, C. S. Liu et al. · 2023 · 20 citations

Optical Interconnection System, Optical Materials, Engineering +29