J.C. Hsieh

High-density MIM capacitors using Al₂O₃ and AlTiO_x dielectrics

S.B. Chen, Chyong‐Huey Lai, Albert Chin et al. · IEEE Electron Device Letters · 2002 · 168 citations

Materials Science, High-density Mim Capacitors, Electrical Engineering +14

40-GHz coplanar waveguide bandpass filters on silicon substrate

K.T. Chan, C.Y. Chen, Albert Chin et al. · IEEE Microwave and Wireless Components Letters · 2002 · 49 citations

High Performance Filter, Electrical Engineering, Millimeter Wave Technology +12

Frequency-dependent capacitance reduction in high-k AlTiO<sub>x</sub> and Al<sub>2</sub>O<sub>3</sub> gate dielectrics from IF to RF frequency range

S.B. Chen, Chyong‐Huey Lai, K.T. Chan et al. · IEEE Electron Device Letters · 2002 · 46 citations

Engineering, Radio Frequency, Electromagnetic Compatibility +18

Investigation and Localization of the SiGe Source/Drain (S/D) Strain-Induced Defects in PMOSFET With 45-nm CMOS Technology

Chiao-Yang Cheng, Y.K. Fang, J.C. Hsieh et al. · IEEE Electron Device Letters · 2007 · 35 citations

Device Modeling, Semiconductor Technology, Electrical Engineering +15

Ultra low p-type SiGe contact resistance FinFETs with Ti silicide liner using cryogenic contact implantation amorphization and Solid-Phase Epitaxial Regrowth (SPER)

Yu‐Chi Yang, N. Breil, C. Y. Yang et al. · 2016 · 26 citations

Engineering, Silicon On Insulator, Semiconductor Device +18