Toyohiro Chikyo - Concepedia

Author

Toyohiro Chikyo

National Institute for Materials Science

Also Known As

T CHIKYO, T. Chikyo, Toyohiro Chikyo

Publications

388

Citations

H-Index

Concepts

All Affiliations

National Institute for Materials Science Waseda University University of Tsukuba Japan Science and Technology Agency Tokyo Institute of Technology

About

Toyohiro Chikyo is an author at National Institute for Materials Science specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	8	8	315
2	Applied Physics	8	8	315
3	Electrical Engineering	5	5	259
4	Natural Sciences	1	1	17
5	Chemistry	1	1	17

Toyohiro Chikyo

Publications

325

Citations

H-Index

Page 1

	Year	Citations
Electron-beam-induced current study of small-angle grain boundaries in multicrystalline silicon Jun Chen, Takashi Sekiguchi, Rong‐Jun Xie, Scripta Materialia Electrical EngineeringSemiconductor DeviceEngineeringPhysicsApplied Physics	2005	101
Effective-Work-Function Control by Varying the TiN Thickness in Poly-Si/TiN Gate Electrodes for Scaled High- $k$ CMOSFETs Masaru Kadoshima, Takeo Matsuki, Seiichi Miyazaki, IEEE Electron Device Letters Low-power ElectronicsMaterials ScienceElectrical EngineeringEngineeringPoly-si/tin Gate Electrodes	2009	63
Physics in Fermi level pinning at the polySi/Hf-based high-k oxide interface Kenji Shiraishi, K. Yamada, Kazuyoshi Torii, EngineeringO VacancySilicon On InsulatorSemiconductor DeviceFermi Level Pinning	2004	48
Characterization of diamond metal-insulator-semiconductor field-effect transistors with aluminum oxide gate insulator Kazuyuki Hirama, Shingo Miyamoto, H. Matsudaira, Applied Physics Letters Diamond-like CarbonElectrical EngineeringSemiconductor DeviceEngineeringNanoelectronics	2006	36
Electrical properties of anatase TiO2 films by atomic layer deposition and low annealing temperature Toshihide Nabatame, Akihiko Ohi, Toyohiro Chikyo, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena Materials EngineeringMaterials ScienceMaterial AnalysisEngineeringOxide Electronics	2014	26
Electronic Structure Study of Local Dielectric Properties of Lanthanoid Oxide Clusters Kentaro Doi, Yutaka Mikazuki, Shinya Sugino, Japanese Journal of Applied Physics Materials ScienceCluster ScienceDielectric ConstantLanthanoid Oxide ClustersEngineering	2008	17
Electron field emission in air at an atmospheric pressure from sp3-bonded 5H-BN microcones Shojiro Komatsu, E. Ohta, Hironori Tanaka, Journal of Applied Physics EngineeringAtmospheric PressureVacuum DeviceElectron Field EmissionBn Films	2007	13
Role of the (Ta/Nb)Ox/Al2O3 interface on the flatband voltage shift for Al2O3/(Ta/Nb)Ox/Al2O3 multilayer charge trap capacitors Toshihide Nabatame, Akihiko Ohi, Kazuhiro Ito, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Materials ScienceSemiconductor TechnologyElectrical EngineeringEngineeringAl2o3-tunneling Layer	2014	11
Photoinduced Phase Transformations in Boron Nitride: New Polytypic Forms of sp<sup>3</sup>-Bonded (6H- and 30H-) BN Shojiro Komatsu, Kazuaki Kobayashi, Yuhei Sato, The Journal of Physical Chemistry C	2010	10

Page 1