K. Yamada

Robust license-plate recognition method for passing vehicles under outside environment

Tomoki Naito, T. Tsukada, K. Yamada et al. · IEEE Transactions on Vehicular Technology · 2000 · 224 citations

Automotive Tracking, Machine Vision, Image Analysis +15

First-principles studies of the intrinsic effect of nitrogen atoms on reduction in gate leakage current through Hf-based high-k dielectrics

Naoto Umezawa, Kenji Shiraishi, Takahisa Ohno et al. · Applied Physics Letters · 2005 · 159 citations · Full text

Engineering, N Atoms, Electron Leakage +17

Impact of additional factors in threshold voltage variability of metal/high-k gate stacks and its reduction by controlling crystalline structure and grain size in the metal gates

Kenji Ohmori, Takeo Matsuki, Dai Ishikawa et al. · 2008 · 105 citations

Random Dopant Fluctuations, Electrical Engineering, Crystal Structure +13

Suppression of oxygen vacancy formation in Hf-based high-k dielectrics by lanthanum incorporation

Naoto Umezawa, Kenji Shiraishi, Seiichi Sugino et al. · Applied Physics Letters · 2007 · 71 citations · Full text

Dielectrics, Engineering, Hf-based High-k Dielectrics +16

Effective-Work-Function Control by Varying the TiN Thickness in Poly-Si/TiN Gate Electrodes for Scaled High- $k$ CMOSFETs

Masaru Kadoshima, Takeo Matsuki, Seiichi Miyazaki et al. · IEEE Electron Device Letters · 2009 · 63 citations

Low-power Electronics, Materials Science, Electrical Engineering +11