B. Kaczer

Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies

Georges Gielen, Pieter De Wit, Elie Maricau et al. · 2008 Design, Automation and Test in Europe · 2008 · 60 citations · Full text

Reliability, Electrical Engineering, Nanometer Cmos Technologies +14

Temperature dependence of the negative bias temperature instability in the framework of dispersive transport

B. Kaczer, R. Degraeve, Nadine Collaert et al. · Applied Physics Letters · 2005 · 55 citations

Engineering, Ultrathin Gate Oxide, Temperature Dependence +19

Ballistic-electron emission microscopy studies of charge trapping in SiO2

B. Kaczer, J. P. Pelz · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 45 citations

Engineering, Trapped Charge Density, Vacuum Device +19

Photo-carrier generation as the origin of Fowler-Nordheim-induced substrate hole current in thin oxides

Mahmoud Rasras, Ingrid De Wolf, G. Groeseneken et al. · IEEE Transactions on Electron Devices · 2001 · 39 citations

Engineering, Thin Oxides, Photo-electrochemical Cell +17

Ballistic electron emission microscopy study of Schottky contacts on 6H- and 4H-SiC

Honggu Im, B. Kaczer, J. P. Pelz et al. · Applied Physics Letters · 1998 · 36 citations

Materials Science, Semiconductor Technology, Electrical Engineering +11