K. van der Jeugd

How far will silicon nanocrystals push the scaling limits of NVMs technologies?

B. De Salvo, C. Gerardi, S. Lombardo et al. · 2004 · 75 citations

Engineering, Electrical Engineering, Materials Science +17

Leakage optimization of ultra-shallow junctions formed by solid phase epitaxial regrowth

Richard Lindsay, K. Henson, W. Vandervorst et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2004 · 31 citations

Engineering, Electrical Engineering, Materials Science +17

Low temperature spike anneal for Ni-silicide formation

A. Lauwers, J. A. Kittl, Mark van Dal et al. · Microelectronic Engineering · 2004 · 24 citations

Natural Sciences, Materials Engineering, Materials Science +5

Development of silicon nitride dots for nanocrystal memory cells

Yating Wan, N. Buffet, K. van der Jeugd et al. · Solid-State Electronics · 2004 · 13 citations

Engineering, Materials Engineering, Materials Science +14

Oxide–nitride–oxide layer optimisation for reliable embedded SONOS memories

R. van Schaijk, M. van Duuren, Wan Yuet Mei et al. · Microelectronic Engineering · 2004 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +16