140
Publications
4.7K
Citations
34
H-Index
1989
Active since
S. Lombardo is an author at Institute for Microelectronics and Microsystems specializing in engineering, applied physics, and electrical engineering.
Top concepts
EngineeringApplied PhysicsElectrical EngineeringMaterial ScienceMicroelectronicsPhysicsNanoelectronicsNanotechnologyOptoelectronicsElectrical Insulation
Publications per year
1989–2023
140
140
Dielectric breakdown mechanisms in gate oxides
S. Lombardo, J. H. Stathis, B.P. Linder et al. · Journal of Applied Physics · 2005 · 427 citations
The impact of gate-oxide breakdown on SRAM stability
R. Rodrı́guez, J. H. Stathis, B.P. Linder et al. · IEEE Electron Device Letters · 2002 · 128 citations
Rows per page
1–5 of 140