Richard S. Flores

Challenges in hardening technologies using shallow-trench isolation

M.R. Shaneyfelt, P.E. Dodd, B.L. Draper et al. · IEEE Transactions on Nuclear Science · 1998 · 245 citations

Engineering, Electrical Engineering, Radiation Dosimetry +14

Impact of technology trends on SEU in CMOS SRAMs

P.E. Dodd, F.W. Sexton, G.L. Hash et al. · IEEE Transactions on Nuclear Science · 1996 · 126 citations

Engineering, Computer Engineering, Electrical Engineering +17

Effects of Total Dose Irradiation on Single-Event Upset Hardness

J.R. Schwank, M.R. Shaneyfelt, J. Félix et al. · IEEE Transactions on Nuclear Science · 2006 · 66 citations

Medicine, Computer Engineering, Electrical Engineering +17

Temperature effects on the radiation response of MOS devices

J.R. Schwank, F.W. Sexton, Daniel M. Fleetwood et al. · IEEE Transactions on Nuclear Science · 1988 · 47 citations

Engineering, Computer Engineering, Electrical Engineering +17

Time-resolved ion beam induced charge collection (TRIBICC) in micro-electronics

H. Schöne, D.S. Walsh, F.W. Sexton et al. · IEEE Transactions on Nuclear Science · 1998 · 47 citations

Engineering, Electrical Engineering, Microelectromechanical Systems +14