Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

Brian D. Sierawski, Jonathan A. Pellish, Robert A. Reed, +14

IEEE Transactions on Nuclear Science

Rate PredictionsLow Energy ProtonsElectrical EngineeringHeavy Ion PhysicEngineering +12

Space Radiation Effects on SiC Power Device Reliability

Jean‐Marie Lauenstein, Megan C. Casey, Ray Ladbury, +3

ReliabilityElectrical EngineeringReliability EngineeringEngineeringPower Mosfet +11

32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches

Kenneth P. Rodbell, David F. Heidel, Jonathan A. Pellish, +12

IEEE Transactions on Nuclear Science

Single Event UpsetSeu PredictionsVlsi DesignEngineeringComputer Architecture +14

Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs

Alan D. Tipton, Jonathan A. Pellish, John M. Hutson, +14

IEEE Transactions on Nuclear Science

Single-Event Effect Performance of a Commercial Embedded ReRAM

Dakai Chen, Hak Kim, Anthony Phan, +5

IEEE Transactions on Nuclear Science

EngineeringEmerging Memory TechnologyComputer ArchitectureEmbedded SystemsEmbedded Architecture +16

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory

Dakai Chen, Edward P. Wilcox, Raymond L. Ladbury, +4

IEEE Transactions on Nuclear Science

Planar NandElectrical EngineeringEngineeringPhysicsFlash Memory +13

Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies

Jonathan A. Pellish, Paul W. Marshall, Kenneth P. Rodbell, +9

IEEE Transactions on Nuclear Science

Hardness AssuranceEngineeringNuclear PhysicsSingle-event EffectsComputer Architecture +17

The effects of operating bias conditions on the proton tolerance of SiGe HBTs

Shiming Zhang, John D. Cressler, Guofu Niu, +7

Solid-State Electronics

EngineeringPhysicsNatural SciencesBias Temperature InstabilityParticle Physics +5

An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays

Melanie D. Berg, Jih-Jong Wang, Ray Ladbury, +7

IEEE Transactions on Nuclear Science

EngineeringVlsi DesignEvolvable HardwareElectronic DesignComputer Architecture +17

Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA

Martha V. O'Bryan, Kenneth A. LaBel, Jonathan A. Pellish, +16

EngineeringRadiation EffectRadiation ExposureTest ResultsSpace System +18