Statistics
Publications
5
Citations
175
H-Index
5
Active since
1991
P. DeHaven is an author at IBM (United States) specializing in electronic materials, natural sciences, and electromigration reliability.
Publications per year
1991–2012
5
5
A high performance liner for copper damascene interconnects
D. Edelstein, Cyprian Uzoh, C. Cabral et al. · 2001 · 92 citations
Engineering, Computer Engineering, Electrical Engineering +17
CVD Co and its application to Cu damascene interconnections
T. Nogami, J. Maniscalco, Anita Madan et al. · 2010 · 43 citations
Natural Sciences, Materials Engineering, Materials Science +15
High reliability 32 nm Cu/ULK BEOL based on PVD CuMn seed, and its extendibility
T. Nogami, T. Bolom, A. Simon et al. · 2010 · 17 citations
Natural Sciences, Materials Engineering, Materials Science +14
1–5 of 5