Masao Nagase

Microscopic thickness determination of thin graphite films formed on<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi>SiC</mml:mi></mml:mrow></mml:math>from quantized oscillation in reflectivity of low-energy electrons

Hiroki Hibino, Hiroyuki Kageshima, Fumihiko Maeda et al. · Physical Review B · 2008 · 359 citations · Full text

Thin Film Physics, Engineering, Microscopic Thickness Determination +18

Three-dimensional siloxane resist for the formation of nanopatterns with minimum linewidth fluctuations

Hideo Namatsu, Yasuo Takahashi, Kenji Yamazaki et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1998 · 285 citations

Engineering, Electron-beam Lithography, Chemistry +22

Size dependence of the characteristics of Si single-electron transistors on SIMOX substrates

Yasuo Takahashi, H. Namatsu, K. Kurihara et al. · IEEE Transactions on Electron Devices · 1996 · 194 citations

Device Modeling, Electrical Engineering, Si Wire +12

Nano-patterning of a hydrogen silsesquioxane resist with reduced linewidth fluctuations

H. Namatsu, Toru Yamaguchi, Masao Nagase et al. · Microelectronic Engineering · 1998 · 156 citations

Engineering, Electronic Materials, Physics +13

Mechanism of bright selective imaging of single-walled carbon nanotubes on insulators by scanning electron microscopy

Yoshikazu Homma, Satoru Suzuki, Yoshihiro Kobayashi et al. · Applied Physics Letters · 2004 · 126 citations

Engineering, Microscopy, Single-walled Carbon Nanotubes +18