Md Nur K. Alam

On the Characterization and Separation of Trapping and Ferroelectric Behavior in HfZrO FET

Md Nur K. Alam, B. Kaczer, Lars‐Åke Ragnarsson et al. · IEEE Journal of the Electron Devices Society · 2019 · 54 citations · Full text

Natural Sciences, Electrical Engineering, Materials Science +16

High performance La-doped HZO based ferroelectric capacitors by interfacial engineering

M. Popovici, Jasper Bizindavyi, Paola Favia et al. · 2022 International Electron Devices Meeting (IEDM) · 2022 · 48 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +16

First principles investigation of charge transition levels in monoclinic, orthorhombic, tetragonal, and cubic crystallographic phases of HfO2

Md Nur K. Alam, Sergiu Clima, Barry O’Sullivan et al. · Journal of Applied Physics · 2021 · 32 citations · Full text

Natural Sciences, Materials Science, Physics +15

Compact Modeling of Multidomain Ferroelectric FETs: Charge Trapping, Channel Percolation, and Nucleation-Growth Domain Dynamics

M. Garcia Bardon, B. Kaczer, Md Nur K. Alam et al. · IEEE Transactions on Electron Devices · 2021 · 30 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Impact of Charge Trapping and Depolarization on Data Retention Using Simultaneous <i>P</i>–<i>V</i> and <i>I</i>–<i>V</i> in HfO₂-Based Ferroelectric FET

Y. Higashi, N. Ronchi, B. Kaczer et al. · IEEE Transactions on Electron Devices · 2021 · 25 citations

Engineering, Electrical Engineering, Materials Science +17