C. Machala

A comprehensive framework for predictive modeling of negative bias temperature instability

S. Chakravarthi, A.T. Krishnan, V. Reddy et al. · 2004 · 328 citations

Engineering, Electrical Engineering, Materials Science +17

Fundamentals of silicon material properties for successful exploitation of strain engineering in modern CMOS manufacturing

P.R. Chidambaram, C. Bowen, S. Chakravarthi et al. · IEEE Transactions on Electron Devices · 2006 · 193 citations

Engineering, Electrical Engineering, Materials Engineering +17

35% drive current improvement from recessed-SiGe drain extensions on 37 nm gate length PMOS

P.R. Chidambaram, B. Smith, Lindsey Hall et al. · 2004 · 89 citations

Engineering, Electrical Engineering, Materials Science +15

An Integrated and Efficient Approach for MOS VLSI Statistical Circuit Design

Ping Yang, D.E. Hocevar, P. Cox et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1986 · 76 citations

Engineering, Computer Engineering, Electrical Engineering +15

Gate length dependent polysilicon depletion effects

Changhoon Choi, P.R. Chidambaram, R. Khamankar et al. · IEEE Electron Device Letters · 2002 · 42 citations

Engineering, Electrical Engineering, Electronic Materials +16