Rainer Minixhofer

Interface traps density-of-states as a vital component for hot-carrier degradation modeling

Stanislav Tyaginov, Ivan A. Starkov, O. Triebl et al. · Microelectronics Reliability · 2010 · 58 citations

Engineering, Electrical Engineering, Materials Science +14

Modeling of Hot-Carrier Degradation in nLDMOS Devices: Different Approaches to the Solution of the Boltzmann Transport Equation

Prateek Sharma, Stanislav Tyaginov, Yannick Wimmer et al. · IEEE Transactions on Electron Devices · 2015 · 39 citations · Full text

Engineering, Electrical Engineering, Microelectronics +16

A 120V 180nm High Voltage CMOS smart power technology for system-on-chip integration

Rainer Minixhofer, N. Feilchenfeld, M. Knaipp et al. · International Symposium on Power Semiconductor Devices and IC's · 2010 · 34 citations

Engineering, Electrical Engineering, Microelectronics +12

Hot-carrier degradation modeling using full-band Monte-Carlo simulations

Stanislav Tyaginov, Ivan A. Starkov, O. Triebl et al. · 2010 · 26 citations

Engineering, Electrical Engineering, Electronic Materials +16

Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS

Jakob Michl, Alexander Grill, Bernhard Stampfer et al. · 2021 IEEE International Electron Devices Meeting (IEDM) · 2021 · 26 citations

Engineering, Electrical Engineering, Physics +17