Melody P. Agustin - Concepedia

Author

Melody P. Agustin

University of California, Santa Barbara

Also Known As

M P Agustin, M. Agustin, M. P. Agustin, M.P. Agustin, Melody Agustin, Melody P Agustin, Melody P. Agustin

Publications

302

Citations

H-Index

Concepts

All Affiliations

University of California, Santa Barbara Rutgers, The State University of New Jersey University of Minnesota North Carolina State University

About

Melody P. Agustin is an author at University of California, Santa Barbara specializing in applied physics, engineering, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	9	9	297
2	Applied Physics	9	9	297
3	Materials Science	8	8	270
4	Electrical Engineering	7	7	258
5	Materials Engineering	2	2	87

Melody P. Agustin

Publications

297

Citations

H-Index

Page 1

	Year	Citations
Lanthanum silicate gate dielectric stacks with subnanometer equivalent oxide thickness utilizing an interfacial silica consumption reaction Daniel J. Lichtenwalner, Jesse S. Jur, Angus I. Kingon, Journal of Applied Physics EngineeringReactive EvaporationSilicon On InsulatorSemiconductorsNanoelectronics	2005	72
Electrical and material characterizations of high-permittivity HfxTi1−xO2 gate insulators M. Li, Z. Zhang, S.A. Campbell, Journal of Applied Physics EngineeringMaterial CharacterizationsThin Film Process TechnologySemiconductor DevicePure Hfo2	2005	52
Scanning transmission electron microscopy of gate stacks with HfO2 dielectrics and TiN electrodes Melody P. Agustin, L. R. C. Fonseca, Jacob C. Hooker, Applied Physics Letters EngineeringOptoelectronic DevicesHfo2 DielectricsSemiconductor DeviceSemiconductor Nanostructures	2005	43
Scanning transmission electron microscopy investigations of interfacial layers in HfO2 gate stacks Melody P. Agustin, G. Bersuker, Brendan Foran, Journal of Applied Physics EngineeringInterfacial ElnesSilicon On InsulatorSemiconductor DeviceSemiconductor Nanostructures	2006	33
Characterization of advanced gate stacks for Si CMOS by electron energy-loss spectroscopy in scanning transmission electron microscopy Brendan Foran, Joel Barnett, Patrick Lysaght, Journal of Electron Spectroscopy and Related Phenomena Electrical EngineeringEngineeringNanoelectronicsApplied PhysicsAdvanced Gate Stacks	2004	27
Strontium hafnate films deposited by physical vapor deposition Ivana McCarthy, Melody P. Agustin, S. Shamuilia, Thin Solid Films Materials ScienceEngineeringSurface ScienceApplied PhysicsStrontium Hafnate Films	2006	20
Thermal stability of amorphous LaScO3 films on silicon L. F. Edge, Darrell G. Schlom, Sandrine Rivillon, Applied Physics Letters Materials ScienceMolecular-beam DepositionOptical MaterialsEngineeringCrystalline Defects	2006	19
Influence of AlN layers on the interface stability of HfO2 gate dielectric stacks Melody P. Agustin, Husam N. Alshareef, Manuel Quevedo-López, Applied Physics Letters EngineeringHfo2 DielectricsSemiconductor DeviceNanoelectronicsMolecular Beam Epitaxy	2006	16
Impact of LER on BEOL dielectric reliability: A quantitative model and experimental validation Zs. Tôkei, Ph. Roussel, Michele Stucchi, ReliabilityMaterials EngineeringElectrical EngineeringMaterials ScienceEngineering	2009	15

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