Tobias Erlbacher

Tunneling atomic-force microscopy as a highly sensitive mapping tool for the characterization of film morphology in thin high-k dielectrics

V. Yanev, Mathias Rommel, M. Lemberger et al. · Applied Physics Letters · 2008 · 85 citations · Full text

Engineering, Microscopy, Tuna Current Maps +19

Reduced On Resistance in LDMOS Devices by Integrating Trench Gates Into Planar Technology

Tobias Erlbacher, Anton J. Bauer, L. Frey · IEEE Electron Device Letters · 2010 · 50 citations · Full text

Device Modeling, Semiconductor Technology, Electrical Engineering +15

The impact of dislocations on AlGaN/GaN Schottky diodes and on gate failure of high electron mobility transistors

Sven Besendörfer, Farid Medjdoub, Joff Derluyn et al. · Scientific Reports · 2020 · 50 citations · Full text

Integrated Digital and Analog Circuit Blocks in a Scalable Silicon Carbide CMOS Technology

Joost Romijn, Sten Vollebregt, Luke M. Middelburg et al. · IEEE Transactions on Electron Devices · 2021 · 50 citations

Engineering, Analog Design, Silicon Carbide +18

Methodology for the investigation of threading dislocations as a source of vertical leakage in AlGaN/GaN-HEMT heterostructures for power devices

Sven Besendörfer, A. G. Lesnik, Jochen Friedrich et al. · Journal of Applied Physics · 2019 · 48 citations · Full text

Materials Science, Wide-bandgap Semiconductor, Electrical Engineering +14