Mathias Rommel

Junction formation and current transport mechanisms in hybrid n-Si/PEDOT:PSS solar cells

Sara Jäckle, Matthias Mattiza, Martin Liebhaber et al. · Scientific Reports · 2015 · 152 citations · Full text

Tunneling atomic-force microscopy as a highly sensitive mapping tool for the characterization of film morphology in thin high-k dielectrics

V. Yanev, Mathias Rommel, M. Lemberger et al. · Applied Physics Letters · 2008 · 85 citations · Full text

Engineering, Microscopy, Tuna Current Maps +19

The influence of the measurement environment on the accuracy of the extraction of the physical parameters of solar cells

Ralph Gottschalg, Mathias Rommel, David Infield et al. · Measurement Science and Technology · 1999 · 70 citations

UV nanoimprint materials: Surface energies, residual layers, and imprint quality

H. Schmitt, L. Frey, H. Ryssel et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2007 · 49 citations · Full text

Materials Science, Imprint Quality, Engineering +15

Comprehensive study of focused ion beam induced lateral damage in silicon by scanning probe microscopy techniques

Mathias Rommel, G. Spoldi, V. Yanev et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2010 · 38 citations · Full text

Engineering, Microscopy, Ion Beam Instrumentation +18