M. Lemberger

Ferroelectricity in yttrium-doped hafnium oxide

Johannes Müller, U. Schröder, T. S. Böscke et al. · Journal of Applied Physics · 2011 · 669 citations

Materials Science, Oxide Heterostructures, Electrical Engineering +13

Tunneling atomic-force microscopy as a highly sensitive mapping tool for the characterization of film morphology in thin high-k dielectrics

V. Yanev, Mathias Rommel, M. Lemberger et al. · Applied Physics Letters · 2008 · 85 citations · Full text

Engineering, Microscopy, Tuna Current Maps +19

Different current conduction mechanisms through thin high-<i>k</i> HfxTiySizO films due to the varying Hf to Ti ratio

A. Paskaleva, Anton J. Bauer, M. Lemberger et al. · Journal of Applied Physics · 2004 · 73 citations

Materials Science, Electrical Engineering, Electronic Devices +15

Detailed leakage current analysis of metal–insulator–metal capacitors with ZrO2, ZrO2/SiO2/ZrO2, and ZrO2/Al2O3/ZrO2 as dielectric and TiN electrodes

Wenke Weinreich, Shariq Ahmed, Konrad Seidel et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2012 · 68 citations

Materials Science, Oxide Heterostructures, Electrical Engineering +15

Impact of interface variations on J–V and C–V polarity asymmetry of MIM capacitors with amorphous and crystalline Zr(1−)Al O2 films

Wenke Weinreich, R. Reiche, M. Lemberger et al. · Microelectronic Engineering · 2009 · 63 citations

Materials Science, C–v Polarity Asymmetry, Material Analysis +9