Wenke Weinreich

Ferroelectric hafnium oxide: A CMOS-compatible and highly scalable approach to future ferroelectric memories

Johannes Müller, T. S. Böscke, Stefan Müller et al. · 2013 · 476 citations

Engineering, Resulting Devices, Thin Film Process Technology +18

Ferroelectric deep trench capacitors based on Al:HfO₂ for 3D nonvolatile memory applications

P. Polakowski, S. Riedel, Wenke Weinreich et al. · 2014 · 110 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +17

Tunneling atomic-force microscopy as a highly sensitive mapping tool for the characterization of film morphology in thin high-k dielectrics

V. Yanev, Mathias Rommel, M. Lemberger et al. · Applied Physics Letters · 2008 · 85 citations · Full text

Engineering, Microscopy, Tuna Current Maps +19

Modeling of leakage currents in high-κ dielectrics: Three-dimensional approach via kinetic Monte Carlo

Gunther Jegert, Alfred Kersch, Wenke Weinreich et al. · Applied Physics Letters · 2010 · 69 citations · Full text

Trap-assisted Tunneling, Engineering, Charge Transport +18

Detailed leakage current analysis of metal–insulator–metal capacitors with ZrO2, ZrO2/SiO2/ZrO2, and ZrO2/Al2O3/ZrO2 as dielectric and TiN electrodes

Wenke Weinreich, Shariq Ahmed, Konrad Seidel et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2012 · 68 citations

Materials Science, Oxide Heterostructures, Electrical Engineering +15