J. A. Maharrey

Estimating Single-Event Logic Cross Sections in Advanced Technologies

R. C. Quinn, J. S. Kauppila, Kevin M. Warren et al. · IEEE Transactions on Nuclear Science · 2017 · 33 citations

Event-driven Architecture, Cross Section, Engineering +22

Utilizing device stacking for area efficient hardened SOI flip-flop designs

J. S. Kauppila, T. D. Loveless, R. C. Quinn et al. · 2014 · 32 citations

Hardware Security, Tilt Angle, Electrical Engineering +15

Angular Effects on Single-Event Mechanisms in Bulk FinFET Technologies

Patrick Nsengiyumva, L. W. Massengill, J. S. Kauppila et al. · IEEE Transactions on Nuclear Science · 2017 · 31 citations

Device Modeling, Electrical Engineering, Angular Effects +13

Effect of Device Variants in 32 nm and 45 nm SOI on SET Pulse Distributions

J. A. Maharrey, R. C. Quinn, T. D. Loveless et al. · IEEE Transactions on Nuclear Science · 2013 · 26 citations

Engineering, Silicon On Insulator, Ion Implantation +18

The Impact of Charge Collection Volume and Parasitic Capacitance on SEUs in SOI- and Bulk-FinFET D Flip-Flops

Dennis R. Ball, Michael L. Alles, J. S. Kauppila et al. · IEEE Transactions on Nuclear Science · 2017 · 23 citations

Engineering, Vlsi Design, Integrated Circuits +18