R. C. Quinn

Estimating Single-Event Logic Cross Sections in Advanced Technologies

R. C. Quinn, J. S. Kauppila, Kevin M. Warren et al. · IEEE Transactions on Nuclear Science · 2017 · 33 citations

Event-driven Architecture, Cross Section, Engineering +22

Utilizing device stacking for area efficient hardened SOI flip-flop designs

J. S. Kauppila, T. D. Loveless, R. C. Quinn et al. · 2014 · 32 citations

Hardware Security, Tilt Angle, Electrical Engineering +15

Effect of Device Variants in 32 nm and 45 nm SOI on SET Pulse Distributions

J. A. Maharrey, R. C. Quinn, T. D. Loveless et al. · IEEE Transactions on Nuclear Science · 2013 · 26 citations

Engineering, Silicon On Insulator, Ion Implantation +18

Geometry-Aware Single-Event Enabled Compact Models for Sub-50 nm Partially Depleted Silicon-on-Insulator Technologies

J. S. Kauppila, L. W. Massengill, Dennis R. Ball et al. · IEEE Transactions on Nuclear Science · 2015 · 21 citations

Device Modeling, Electrical Engineering, Compact Model +15

Heavy-Ion Induced SETs in 32nm SOI Inverter Chains

J. A. Maharrey, J. S. Kauppila, R. C. Quinn et al. · 2015 · 14 citations

Ibm 32Nm, Electrical Engineering, Engineering +11