Ponky Ivo

Reliability issues of GaN based high voltage power devices

Joachim Wuerfl, Eldad Bahat‐Treidel, Frank Brunner et al. · Microelectronics Reliability · 2011 · 57 citations

Reliability Issues, Electrical Engineering, Engineering +4

OFF-State Degradation of AlGaN/GaN Power HEMTs: Experimental Demonstration of Time-Dependent Drain-Source Breakdown

Matteo Meneghini, Giulia Cibin, Marco Bertin et al. · IEEE Transactions on Electron Devices · 2014 · 44 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +14

Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements

Ponky Ivo, A. Glowacki, Eldad Bahat‐Treidel et al. · Microelectronics Reliability · 2010 · 31 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +7

Influence of GaN cap on robustness of AlGaN/GaN HEMTs

Ponky Ivo, A. Glowacki, R. Pazirandeh et al. · 2009 · 27 citations

Electrical Engineering, Engineering, Gan Hemts +9

Single- and double-heterostructure GaN-HEMTs devices for power switching applications

A. Zanandrea, Eldad Bahat‐Treidel, Fabiana Rampazzo et al. · Microelectronics Reliability · 2012 · 15 citations · Full text

Electrical Engineering, Engineering, Power Switching Applications +4