A. Glowacki

Systematic Characterization of Integrated Circuit Standard Components as Stimulated by Scanning Laser Beam

A. Glowacki, Sanjib Kumar Brahma, Hiroyoshi Suzuki et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 33 citations

Engineering, Integrated Circuits, Failure Localization +16

Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements

Ponky Ivo, A. Glowacki, Eldad Bahat‐Treidel et al. · Microelectronics Reliability · 2010 · 31 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +7

Influence of GaN cap on robustness of AlGaN/GaN HEMTs

Ponky Ivo, A. Glowacki, R. Pazirandeh et al. · 2009 · 27 citations

Electrical Engineering, Engineering, Gan Hemts +9

Thermal Laser Stimulation of active devices in silicon - a quantitative FET parameter investigation

Christian Boit, A. Glowacki, Sanjib Kumar Brahma et al. · 2004 · 18 citations

Electrical Engineering, Semiconductor Device, Engineering +13

Physical IC debug – backside approach and nanoscale challenge

Christian Boit, Rudolf Schlangen, A. Glowacki et al. · Advances in radio science · 2008 · 14 citations · Full text

Engineering, Ic Functionality, Integrated Circuits +18