NBTI from the perspective of defect states with widely distributed time scales

B. Kaczer, Tibor Grasser, J. Martín-Martínez, +4

IEEE International Reliability Physics Symposium proceedings

EngineeringDefect ToleranceDefect TimesReliability EngineeringDefect States +16

Insight Into N/PBTI Mechanisms in Sub-1-nm-EOT Devices

Moonju Cho, Jae-Duk Lee, M. Aoulaiche, +7

IEEE Transactions on Electron Devices

Semiconductor TechnologyElectrical EngineeringEngineeringPhysicsNanoelectronics +10

Channel Hot Carrier Degradation Mechanism in Long/Short Channel $n$-FinFETs

Moonju Cho, Philippe Roussel, B. Kaczer, +7

IEEE Transactions on Electron Devices

Device ModelingHot Carrier InjectionElectrical EngineeringLong/short ChannelEngineering +10

Reaction-dispersive proton transport model for negative bias temperature instabilities

Michel Houssa, M. Aoulaiche, Stefan De Gendt, +3

Applied Physics Letters

Device ModelingElectrical EngineeringEngineeringPhysicsNanoelectronics +13

Review of reliability issues in high-k/metal gate stacks

R. Degraeve, M. Aoulaiche, B. Kaczer, +4

ReliabilityReliability IssuesElectrical EngineeringReliability EngineeringEngineering +9

Positive Bias Temperature Instability in nMOSFETs with ultra-thin Hf-silicate gate dielectrics

Felice Crupi, C. Nick Pace, G. Cocorullo, +3

Microelectronic Engineering

Electrical EngineeringEngineeringNanoelectronicsBias Temperature InstabilityApplied Physics +3

Realizing super-steep subthreshold slope with conventional FDSOI CMOS at low-bias voltages

Zhichao Lu, Nadine Collaert, M. Aoulaiche, +5

Low-power ElectronicsSuper-steep Subthreshold SlopeElectrical EngineeringRecord Steep SsVlsi Design +11

Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics

Sara Dereste dos Santos, B. Cretu, V. Strobel, +7

Solid-State Electronics

Electrical EngineeringEngineeringRf SemiconductorHigh-frequency DeviceElectronic Engineering +6

Low leakage Ru-strontium titanate-Ru metal-insulator-metal capacitors for sub-20 nm technology node in dynamic random access memory

M. Popovici, J. Swerts, A. Redolfi, +7

Applied Physics Letters

Materials ScienceMaterials EngineeringElectrical EngineeringBottom ElectrodeEngineering +10

Overview of 3D NAND Technologies and Outlook Invited Paper

Srinath Venkatesan, M. Aoulaiche

3D Ic ArchitectureElectrical EngineeringEngineeringVlsi DesignMicrofabrication +13