M.-P. Samson

Scaling of Trigate Junctionless Nanowire MOSFET With Gate Length Down to 13 nm

Sylvain Barraud, Matthieu Berthomé, R. Coquand et al. · IEEE Electron Device Letters · 2012 · 259 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

3D Sequential Integration: Application-driven technological achievements and guidelines

P. Batude, Laurent Brunet, C. Fenouillet-Béranger et al. · 2017 · 75 citations

Engineering, Computer Engineering, Electrical Engineering +15

Monolithic 3D integration: A powerful alternative to classical 2D scaling

M. Vinet, P. Batude, C. Fenouillet-Béranger et al. · 2014 · 57 citations

Engineering, Electrical Engineering, Microelectronics +16

New insights on bottom layer thermal stability and laser annealing promises for high performance 3D VLSI

C. Fenouillet-Béranger, B. Mathieu, B. Prévitali et al. · 2014 · 56 citations

Engineering, Electrical Engineering, Materials Science +17

Very Low Temperature (Cyclic) Deposition / Etch of In Situ Boron-Doped SiGe Raised Sources and Drains

Jean‐Michel Hartmann, V. Benevent, Agathe André et al. · ECS Journal of Solid State Science and Technology · 2014 · 13 citations

Engineering, Materials Engineering, Materials Science +17