Agathe André

Defect analysis in low temperature atomic layer deposited Al2O3 and physical vapor deposited SiO barrier films and combination of both to achieve high quality moisture barriers

Tony Maindron, Tony Jullien, Agathe André · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2016 · 31 citations

Natural Sciences, Materials Engineering, Materials Science +17

Study of annealing-induced interdiffusion in In2O3/Ag/In2O3 structures by a combined X-ray reflectivity and grazing incidence X-ray fluorescence analysis

B. Caby, Fabio Brigidi, Dieter Ingerle et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 2015 · 16 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +12

Very Low Temperature (Cyclic) Deposition / Etch of In Situ Boron-Doped SiGe Raised Sources and Drains

Jean‐Michel Hartmann, V. Benevent, Agathe André et al. · ECS Journal of Solid State Science and Technology · 2014 · 13 citations

Engineering, Materials Engineering, Materials Science +17

High-performance silver-dielectric interference filters for RGBIR imaging

Laurent Frey, L. Masarotto, L. El Melhaoui et al. · Optics Letters · 2018 · 11 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Systematic combination of X-ray reflectometry and spectroscopic ellipsometry: A powerful technique for reliable in-fab metrology

Emmanuel Nolot, Agathe André · Thin Solid Films · 2010 · 10 citations

Natural Sciences, Materials Science, Physics +15