Concepedia

Author

Emmanuel Nolot

Laboratoire d'Électronique des Technologies de l'Information

Also Known As

E Nolot, E. Nolot, Emmanuel Nolot, Grampeix, Helen, Nolot, E., Nolot, Emmanuel, W Rossi

114

Publications

928

Citations

17

H-Index

72

Concepts

All Affiliations

Laboratoire d'Électronique des Technologies de l'InformationCommissariat à l'Énergie Atomique et aux Énergies AlternativesCEA GrenobleUniversité Grenoble AlpesInstitut polytechnique de Grenoble
EN

About

Emmanuel Nolot is an author at Laboratoire d'Électronique des Technologies de l'Information specializing in applied physics, engineering, and materials science.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

16

23

506

2

Natural Sciences

4

4

62

3

Health Sciences

3

3

71

4

Education

1

1

16

5

Medicine

1

1

17

Emmanuel Nolot

×

34

Publications

771

Citations

17

H-Index

YearCitations

A novel 2-step ALD route to ultra-thin MoS<sub>2</sub>films on SiO<sub>2</sub>through a surface organometallic intermediate

Stéphane Cadot, O. Renault, Mathieu Frégnaux,

Nanoscale

2016

79

Germanium, antimony, tellurium, their binary and ternary alloys and the impact of nitrogen: An X-ray photoelectron study

Emmanuel Nolot, C. Sabbione, Walter Batista Pessoa,

Applied Surface Science

2020

72

Role of vacancy defects in Al doped ZnO thin films for optoelectronic devices

H. Rotella, Yann Mazel, Stéphane Brochen,

Journal of Physics D Applied Physics

2017

69

Tailoring the Switching Dynamics in Yttrium Oxide‐Based RRAM Devices by Oxygen Engineering: From Digital to Multi‐Level Quantization toward Analog Switching

Stefan Petzold, Eszter Piros, Robert Eilhardt,

Advanced Electronic Materials

2020

35

Reference-free grazing incidence x-ray fluorescence and reflectometry as a methodology for independent validation of x-ray reflectometry on ultrathin layer stacks and a depth-dependent characterization

Philipp Hönicke, Blanka Detlefs, Emmanuel Nolot,

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

2019

34

Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene

Benjamen P. Reed, David J. H. Cant, Steven J. Spencer,

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

2020

30

Carbon electrode for Ge-Se-Sb based OTS selector for ultra low leakage current and outstanding endurance

Anthonin Verdy, G. Navarro, M. Bernard,

2018

27

In-line characterization of ultrathin transition metal dichalcogenides using X-ray fluorescence and X-ray photoelectron spectroscopy

Emmanuel Nolot, Stéphane Cadot, F. Martín,

Spectrochimica Acta Part B Atomic Spectroscopy

2020

25

X‐Ray Diffraction Microstrain Analysis for Extraction of Threading Dislocation Density of GaN Films Grown on Silicon, Sapphire, and SiC Substrates

Victor Yon, N. Rochat, Matthew Charles,

physica status solidi (b)

2020

25

Temperature driven structural evolution of Ge-rich GeSbTe alloys and role of N-doping

L. Prazakova, Emmanuel Nolot, E. Martínez,

Journal of Applied Physics

2020

25

Page 1