Yann Mazel

Role of vacancy defects in Al doped ZnO thin films for optoelectronic devices

H. Rotella, Yann Mazel, Stéphane Brochen et al. · Journal of Physics D Applied Physics · 2017 · 69 citations

Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysis

H. Rotella, B. Caby, Yves Ménesguen et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 2017 · 22 citations · Full text

Materials Science, X-ray Spectroscopy, Engineering +9

Advanced characterizations of fluorine-free tungsten film and its application as low resistance liner for PCRAM

Philippe Rodriguez, R. Famulok, Y. Le Friec et al. · Materials Science in Semiconductor Processing · 2017 · 20 citations · Full text

Materials Engineering, Materials Science, Chemical Engineering +9

Study of Ge-rich GeSbTe etching process with different halogen plasmas

Yann Canvel, S. Lagrasta, Christelle Boixaderas et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2019 · 19 citations · Full text

Engineering, Vacuum Device, Chemistry +16

Grazing incident X-ray fluorescence combined with X-ray reflectometry metrology protocol of telluride-based films using in-lab and synchrotron instruments

Walter Batista Pessoa, A. Roule, Emmanuel Nolot et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 2018 · 16 citations

Materials Science, Engineering, Health Sciences +14