Philipp Hönicke

A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies

Janin Lubeck, Burkhard Beckhoff, R. Fliegauf et al. · Review of Scientific Instruments · 2013 · 105 citations

X-ray Crystallography, X-ray Spectroscopy, Engineering +25

Depth profile characterization of ultra shallow junction implants

Philipp Hönicke, Burkhard Beckhoff, Michael Kolbe et al. · Analytical and Bioanalytical Chemistry · 2009 · 59 citations

Engineering, Microfabrication, Applied Physics +5

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Michael Kolbe, Philipp Hönicke, Matthias Müller et al. · Physical Review A · 2012 · 54 citations

Engineering, Bessy Ii, Stochastic Analysis +25

Towards a traceable enhancement factor in surface-enhanced Raman spectroscopy

Eleonora Cara, Luisa Mandrile, Alessio Sacco et al. · Journal of Materials Chemistry C · 2020 · 46 citations · Full text

Traceable Enhancement Factor, Engineering, Optical Properties +14

Characterization of High-k Nanolayers by Grazing Incidence X-ray Spectrometry

Matthias Müller, Philipp Hönicke, Blanka Detlefs et al. · Materials · 2014 · 44 citations · Full text