R. Fliegauf

Reference-Free Total Reflection X-ray Fluorescence Analysis of Semiconductor Surfaces with Synchrotron Radiation

Burkhard Beckhoff, R. Fliegauf, Michael Kolbe et al. · Analytical Chemistry · 2007 · 119 citations

Natural Sciences, Materials Engineering, Materials Science +16

A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies

Janin Lubeck, Burkhard Beckhoff, R. Fliegauf et al. · Review of Scientific Instruments · 2013 · 111 citations

Natural Sciences, Chemistry, Analytical Chemistry +16

High-accuracy EUV metrology of PTB using synchrotron radiation

Frank Scholze, Burkhard Beckhoff, G. Mirek Brandt et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2001 · 80 citations

Engineering, Nuclear Engineering, Instrumentation +13

Operation of the Metrology Light Source as a primary radiation source standard

R. Klein, G. Mirek Brandt, R. Fliegauf et al. · Physical Review Special Topics - Accelerators and Beams · 2008 · 68 citations · Full text

Natural Sciences, Physics, Metrology +10

<title>New PTB beamlines for high-accuracy EUV reflectometry at BESSY II</title>

Frank Scholze, Burkhard Beckhoff, G. Mirek Brandt et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000 · 33 citations

Natural Sciences, Physics, Optics +9