Y. J. Mii

Totally relaxed Ge<i>x</i>Si1−<i>x</i> layers with low threading dislocation densities grown on Si substrates

Eugene A. Fitzgerald, Y. H. Xie, M. L. Green et al. · Applied Physics Letters · 1991 · 688 citations

Engineering, Materials Engineering, Materials Science +16

Extremely high electron mobility in Si/Ge<i>x</i>Si1−<i>x</i> structures grown by molecular beam epitaxy

Y. J. Mii, Y. H. Xie, Eugene A. Fitzgerald et al. · Applied Physics Letters · 1991 · 261 citations

Engineering, Materials Science, Physics +17

VLSI on-chip interconnection performance simulations and measurements

D. Edelstein, G.A. Sai-Halasz, Y. J. Mii · IBM Journal of Research and Development · 1995 · 140 citations

Engineering, Computer Engineering, Electrical Engineering +17

Tunable infrared modulator and switch using Stark shift in step quantum wells

R. P. G. Karunasiri, Y. J. Mii, K.L. Wang · IEEE Electron Device Letters · 1990 · 126 citations

Engineering, Electrical Engineering, Physics +17

CMOS scaling into the 21st century: 0.1 µm and beyond

Y. Taur, Y. J. Mii, D.J. Frank et al. · IBM Journal of Research and Development · 1995 · 113 citations

Engineering, Computer Engineering, Electrical Engineering +17